FIRST CALL FOR TUTORIAL PROPOSALS
- Call for Tutorial Proposals for all other TTEP 2006 events will be announced shortly -

Scope

The Tutorials & Education Group (TEG) of the IEEE Computer Society Test Technology Technical Council (TTTC) organizes in 2006 a comprehensive set of Test Technology Tutorials to be held in conjunction with TTTC sponsored technical meetings. The objective of this call is to invite submissions for tutorial proposals in order to enable selecting the best fitted tutorials for each technical meeting, as part of the annual Test Technology Educational Program (TTEP). The tutorials accepted by the Program Committee will be
included in the Test Technology Educational Program, the intent of which is to serve the test and design professionals offering fundamental education and expert knowledge in state-of-the-art test technology topics. Participation in TTEP-organized tutorials is credited by IEEE Computer Society. Each full day tutorial corresponds to four TTEP units. Upon completion of each sixteen units official accreditation in the form of the “IEEE TTTC Test Technology Certificate” is presented to the participants.

This First Call for Tutorial Proposals invites half-day (3-hours) proposals for the Design Automation and Test in Europe Conference (DATE 2006), March 6-10, Munich, Germany.

The Call for Tutorial Proposals for all other TTEP 2006 events and corresponding deadlines will be
announced shortly.

TTEP accommodates a wide range of technical areas, from mature test topics of high interest to industrial test engineers to emerging test topics with emphasis on novelty. Topics of interest for year 2006 TTEP Tutorials include (but are not limited to):

Automatic test equipment
Board-level testing
Built-In Self-Test
Defect oriented testing
Design for testability
DFT testers
Diagnosis and debug
Embedded core testing
High-speed interface testing
Interconnect characterization
Memory testing
Mixed-Signal/Analog testing
Nanometer techn. testing
On-line and field testing
Performance/Delay testing
Power issues in testing
System-level testing
Test economics
Test synthesis
Test resource partitioning
Validation
Verification
Wafer testing
Yield optimization and test

Submission Information

top

Submissions
All tutorial proposal submissions to TTEP 2006 are to be made electronically through the TTEP submissions website: http://cad.cs.unipi.gr/~ttep

Deadlines and key dates

October 14, 2005: Deadline for DATE 2006 test tutorial proposals.

November 25, 2005: Notification of acceptance for DATE 2006.

Contact Information

Dimitris Gizopoulos
TTEP Chair
University of Piraeus
T: +30 210 414 2372
F: +30 210 414 2264
E: dgizop@unipi.gr

Anand Raghunathan
TTEP Vice Chair (Organization)
NEC USA, C&C Research Labs
T: +1 609 951 2967
F: +1 609 951 2499
E: anand@nec-labs.com

Kaushik Roy
TTEP Vice Chair (Program)
Purdue University
T: +1 765 494-2361
F: +1 765 494-3371
E: kaushik@ecn.purdue.edu

TTEP central web site: http://tab.computer.org/tttc/teg/ttep

TTEP web site for submissions: http://cad.cs.unipi.gr/~ttep

For more information, visit us on the web at: http://tab.computer.org/tttc/teg/ttep

The Test Technology Educational Program 2006 (TTEP 2006) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

TTTC's Electronic Broadcasting Service
	TTEP 2006 TEST TECHNOLOGY EDUCATIONAL PROGRAM 2006 Test Tutorials at DATE 2006 March 6-10, Munich, Germany http://tab.computer.org/tttc/teg/ttep

FIRST CALL FOR TUTORIAL PROPOSALS - Call for Tutorial Proposals for all other TTEP 2006 events will be announced shortly -
Scope -- Submission Information
Scope	top
The Tutorials & Education Group (TEG) of the IEEE Computer Society Test Technology Technical Council (TTTC) organizes in 2006 a comprehensive set of Test Technology Tutorials to be held in conjunction with TTTC sponsored technical meetings. The objective of this call is to invite submissions for tutorial proposals in order to enable selecting the best fitted tutorials for each technical meeting, as part of the annual Test Technology Educational Program (TTEP). The tutorials accepted by the Program Committee will be included in the Test Technology Educational Program, the intent of which is to serve the test and design professionals offering fundamental education and expert knowledge in state-of-the-art test technology topics. Participation in TTEP-organized tutorials is credited by IEEE Computer Society. Each full day tutorial corresponds to four TTEP units. Upon completion of each sixteen units official accreditation in the form of the “IEEE TTTC Test Technology Certificate” is presented to the participants. This First Call for Tutorial Proposals invites half-day (3-hours) proposals for the Design Automation and Test in Europe Conference (DATE 2006), March 6-10, Munich, Germany. The Call for Tutorial Proposals for all other TTEP 2006 events and corresponding deadlines will be announced shortly. TTEP accommodates a wide range of technical areas, from mature test topics of high interest to industrial test engineers to emerging test topics with emphasis on novelty. Topics of interest for year 2006 TTEP Tutorials include (but are not limited to): Automatic test equipment Board-level testing Built-In Self-Test Defect oriented testing Design for testability DFT testers Diagnosis and debug Embedded core testing High-speed interface testing Interconnect characterization Memory testing Mixed-Signal/Analog testing Nanometer techn. testing On-line and field testing Performance/Delay testing Power issues in testing System-level testing Test economics Test synthesis Test resource partitioning Validation Verification Wafer testing Yield optimization and test
Submission Information	top
Submissions All tutorial proposal submissions to TTEP 2006 are to be made electronically through the TTEP submissions website: http://cad.cs.unipi.gr/~ttep Deadlines and key dates October 14, 2005: Deadline for DATE 2006 test tutorial proposals. November 25, 2005: Notification of acceptance for DATE 2006. Contact Information Dimitris Gizopoulos TTEP Chair University of Piraeus T: +30 210 414 2372 F: +30 210 414 2264 E: dgizop@unipi.gr Anand Raghunathan TTEP Vice Chair (Organization) NEC USA, C&C Research Labs T: +1 609 951 2967 F: +1 609 951 2499 E: anand@nec-labs.com Kaushik Roy TTEP Vice Chair (Program) Purdue University T: +1 765 494-2361 F: +1 765 494-3371 E: kaushik@ecn.purdue.edu TTEP central web site: http://tab.computer.org/tttc/teg/ttep TTEP web site for submissions: http://cad.cs.unipi.gr/~ttep
For more information, visit us on the web at: http://tab.computer.org/tttc/teg/ttep
The Test Technology Educational Program 2006 (TTEP 2006) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).